Mfg Part Number: 353-3793-032 | Alternate P/N: 3533793032 | NSN : 5961-01-419-4623 |
NIIN : 014194623 | CAGE Code : 13499 | Manufacturer: Rockwell Collins Inc |
Item Name : Semiconductor Devic | FSC : 5961 Semiconductor Devices and Associated Hardware |
Integrated AOG is your sourcing solution for all your NSN part 353-3793-032 under 5961 Semiconductor Devices and Associated Hardware needs, presenting NSN 5961-01-419-4623 by Rockwell Collins Inc at competitive prices. This Semiconductor Devic NSN item is listed alongside the part number 353-3793-032, and it is readily available for purchase from our website at any time. If you would like to learn more about this item and receive a customized quote for your comparisons, fill out and submit an RFQ form as provided on our website at your earliest convenience. Please be sure to let us know details such as your target price and expected shipping time as this will allow us to tailor the best solution for your needs. With team members available for customer needs around the clock, we promise responses to quote requests within 15 minutes of receiving a completed form.
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NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5961-01-419-4623 Item Description: Semiconductor Devic | 5961 | 014194623 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | A | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
353-3793-032 | 5 | 1 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
ABBH | INCLOSURE MATERIAL | CERAMIC ALL SEMICONDUCTOR DEVICE DIODE AND METAL ALL SEMICONDUCTOR DEVICE DIODE |
ABHP | OVERALL LENGTH | 0.205 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.225 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
ADAV | OVERALL DIAMETER | 0.119 INCHES MINIMUM ALL SEMICONDUCTOR DEVICE DIODE AND 0.124 INCHES MAXIMUM ALL SEMICONDUCTOR DEVICE DIODE |
AGAV | END ITEM IDENTIFICATION | JTIDS |
ASDD | COMPONENT FUNCTION RELATIONSHIP | MATCHED |
ASKA | COMPONENT NAME AND QUANTITY | 4 SEMICONDUCTOR DEVICE DIODE |
AXGY | MOUNTING METHOD | PRESS FIT ALL SEMICONDUCTOR DEVICE DIODE |
BBJD | FIELD FORCE EFFECT TYPE | ELECTROSTATIC CHARGE |
CTMZ | SEMICONDUCTOR MATERIAL | SILICON ALL SEMICONDUCTOR DEVICE DIODE |
CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 35.0 MINIMUM BREAKDOWN VOLTAGE, DC ALL SEMICONDUCTOR DEVICE DIODE |
CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS JUNCTION ALL SEMICONDUCTOR DEVICE DIODE |
TEST | TEST DATA DOCUMENT | 13499-952-6557-001 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECT |
TTQY | TERMINAL TYPE AND QUANTITY | 2 CASE ALL SEMICONDUCTOR DEVICE DIODE |
ZZZK | SPECIFICATION/STANDARD DATA | 13499-353-3793 MANUFACTURERS SPECIFICATION |
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